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Langer EMV S603/S750 Probe Set 1Ω/150Ω Conducted RF Measurement acc. IEC 61967-4

$ 4218.19

Availability: 10 in stock
  • Condition: New
  • MPN: S603/S750
  • All returns accepted: ReturnsNotAccepted
  • Country/Region of Manufacture: Germany
  • Brand: Langer EMV

    Description

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    Langer EMV S603/S750 Probe Set 1Ω/150Ω Conducted RF Measurement acc. IEC 61967-4
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    PRODUCT DESCRIPTION
    This item is a new
    Langer EMV S603/S750 Probe Set 1Ω/150Ω Conducted RF Measurement according to IEC 61967-4.
    Please allow
    2 - 3
    weeks lead time for this product to arrive.
    This set consists of:
    1xS603, 1 Ohm, RF Current Probe, 0 kHz - 3 GHz acc. to IEC 61967-4
    1xS750, 150 Ohm, RF Voltage Probe, 100 kHz - 3 GHz acc. to IEC 61967-4
    1xSMA-SMA 1 m, SMA-SMA Measuring Cable
    This item comes with a 12 Month (One Year) warranty
    from the
    manufacturer.
    We Calibrate your Test Equipment! Contact us for more information on Calibration by
    visiting
    stratatek.com/calibration
    This probe set is used to measure conducted emissions 1 Ohm/150 Ohm with the direct coupling method on IC pins. The S603 probe is used for current measurement and the S750 probe is used for voltage measurement.
    The measurements with the S603/S750 ensure a high repeatability and comparability of the measurements. The measurements can be performed with the ChipScan-ESA software. The measurement results of all measured pins are saved with the help of the software. It allows systematically and quickly comparison and analysis of the measured data.
    The
    S603 probe
    is a 1 Ω-probe for direct measurement of high frequency (RF) current at IC pins. It is used to measure at supply pins (Vdd / Vss) and signal pins. The S603  1 Ohm RF current probe has a pin contact with which every IC pin can be separately contacted and measured
    By means of an SMA - connection the probe can be easily connected to the IC test boards. The S603 probe is designed for measuring on ground lines (Vss).
    The
    S750 probe
    is a RF-Voltmeter for conducted measurement of high frequency voltage on IC pins. The S750 complies with the 150 Ω coupling network according to IEC 61967-4 up to a frequency of 3 GHz.
    By means of a SMA connection, the S750 probe can be easily connected to the IC test board. The S750 probe is designed for measuring on signal lines.
    Any questions or clarifications, feel free to ask
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    About Us
    Stratatek Test & Measurement is a source for new and used test equipment, measurement equipment, and industrial process & control calibrators and meters. We calibrate in-house, traceable to NIST.
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    Yes, all of our prices are in United States Dollars (USD)
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